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 Position:Products >> Seismic Data Processing



 Onsite Seismic Data Processing Software

Software Overview


LD-SeisFast is a highly efficient onsite seismic data processing software package. The software package consists of a set of

conventional processing function modules: including data reformatting, geometry definition & QC, bad shot editing, refraction

and reflection statics, noise attenuation, amplitude recovery, deconvolution, velocity analysis and stack. LD-SeisFast can

be used to quickly and effectively analyze field data acquisition methods and parameters, and to monitor the data quality on a

daily basis.


Software Functions


  • • Quality control of data acquisition: Monitor maps such as R-S location, R-S elevation distribution, offset distribution, azimuth and fold, can be displayed in the attributes window.
  • • Spectrum analysis and frequency scanningSpectrum analysis can be done along the entire trace or within a time window. Also has a frequency scanning function which can be used to investigate the range of frequency-bandwidth distributions of primaries and/or noise recorded.
  • • Noise analysis and removalUsed to investigate the various sources of noise, such as ground roll, linear noise, multiples and so on. The noise can then be removed by different techniques such as 3D dip filtering and wave-field separation multiple attenuation and so on.
  • • Amplitude decay analysis and compensation: Amplitude differences between shots can be analyzed and compensated for, as well as amplitude compensation to balance the energy decay between the shallow and deep parts of the shot record.
  • • Refraction statics: Automatic first arrival picking, batch anomalous pick editing, and refraction statics computation can be performed to obtain the shot and receiver refraction static values.
  • • Surface consistent deconvolution: Spatially varied and multi-time window operator design can be used to obtain a more representative operator, which can then effectively improve the data resolution in the time and spatial domains.
  • • Residual reflection statics: Residual statics computations can further solve residual statics and improve the quality of the stack sections.
  • • Velocity analysis: Efficient and finely detailed analysis suitable for high S/N data, and a variable-velocity scanning module which is more suitable for low S/N data.



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